International Scanning Probe Microscopy Seoul 2014 is the 16th meeting in a continuing series of international meetings featuring research on scanning probe microscopy (SPM), sensors, and nanostructures that began in Seattle in 1999. The goal of this meeting is to communicate the latest developments and applications of scanning probe microscopy methods. This meeting attracts researchers working in academia, government, and industry. It rotates around the world (USA, Germany, Japan, UK, China, Mexico, France, Korea, Spain, and Canada) and the last one was held at Dijon, France. Now, it comes back to Korea!


In the last 30 years, SPM techniques have revolutionized research and development in materials, furthering progress in nanotechnology and biology. This meeting is dedicated to the discussion of the latest developments in SPM techniques and their applications at the interface of physics, biology, materials sciences, chemistry, and engineering. At this meeting, the emphasis will be given on bio- and nano-technologies.

The symposium presents opportunities to listen and discuss novel developments and applications of SPM methods, providing a chapter to meet leading researchers during lectures and informal discussions from June 29-July 2, 2014. Poster sessions and technical exhibition of leading AFM suppliers will also be arranged within the conference. Conference and exhibition will be held at Sogang University, Seoul.


I wish you participation of ISPM 2014 and meeting at Seoul.



Joon Won Park (POSTECH)



Jeong-Woo Choi (Sogang Univ.)



Jwa-Min Nam (Seoul National Univ.), Junhong Min (Chung-Ang Univ.), Hoon-Kyu Shin (NINT ), Zee Hwan Kim (Seoul National Univ.)  



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